• 8th Biannual European - Latin American Summer School on Design, Test and Reliability

    June 20-22, 2018, Tallinn, Estonia
We do not want to miss a single summer! BELAS is organized twice a year during the summers in the Northern and Southern Hemispheres. Distinguished speakers from Latin America and Europe will share their knowledge with PhD students, engineers and researchers. Participants are invited to present their research at the PhD Forum. This time we will celebrate the 5th anniversary of BELAS!


Effects of radiation in integrated circuits: origins, mitigation techniques, tests and real-life experiments

Raoul Velazco, TIMA Laboratory, France

Resilient Multicore Systems using Software-Based Self-Test

Maria K. Michael, University of Cyprus, Cyprus

Design & Test Challenges in FinFET Based Circuits

Victor Champac, INAOE, Puebla, Mexico

10 years Cadence Academic Network, an example of successful industry-academia partnership

Anton Klotz, Cadence Design Systems, Germany

On-Chip Health Monitoring and Fault Management for Self-Health-Aware SoCs

Artur Jutman, Testonica Lab, Estonia

Combined Effects of Ionizing Radiation and Electromagnetic Interference

Fabian Vargas, PUCRS, Brazil

Transient Faults Analysis Management for High-Reliability Applications

Maximilien Glorieux, IROC, France

Guidelines for the Radiation Test of Electronic Devices and Systems

Paolo Rech, UFRGS, Brazil

System Level Design Space Exploration for Reliability and Efficiency in Design of Abstract Communications

Zain Navabi, University of Tehran, Iran / WPI, USA

Ethical writing: a crash course for PhDs

Maarja Kruusmaa, TUT, Estonia

The Venue

The event will be located in the TALLINK SPA & CONFERENCE HOTEL ★★★★

Address: Sadama 11a, 10111 Tallinn, Estonia


We suggest all the participants (apart from the Tallinn citizens) to stay at the Tallink Spa & Conference Hotel.

Room reservation details are available from this page